Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition. - Amrane Oukaour; Boubekeur Tala-Ighil; Bertrand Pouderoux; M. Tounsi; M. Bouarroudj-Berkani; Stéphane Lefebvre; Bertrand Boudart (Microelectron. Reliab., 2011)

Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour. - Boubekeur Tala-Ighil; Amrane Oukaour; Hamid Gualous; Bertrand Boudart; Bertrand Pouderoux; Jean-Lionel Trolet; Marc Piccione (Microelectron. Reliab., 2011)