Signal generators for cost effective BIST of ADCs. - Bharath K. Vasan; Jingbo Duan; Chen Zhao; Randall L. Geiger; Degang Chen 001 (ECCTD, 2009)

Linearity testing of ADCs using low linearity stimulus and Kalman filtering. - Bharath K. Vasan; Randall L. Geiger; Degang Chen 001 (ISCAS, 2010)

Sinusoidal signal generation for production testing and BIST applications. - Bharath K. Vasan; Siva Sudani; Degang Chen 001; Randall L. Geiger (ISCAS, 2012)

On Chip Signal Generators for Low Overhead ADC BIST. - Jingbo Duan; Bharath K. Vasan; Chen Zhao; Degang Chen 001; Randall L. Geiger (J. Electron. Test., 2012)

Low-Distortion Sine Wave Generation Using a Novel Harmonic Cancellation Technique. - Bharath Karthik Vasan; Siva Kumar Sudani; Degang Chen 001; Randall L. Geiger (IEEE Trans. Circuits Syst. I Regul. Pap., 2013)