Polysilicon Fatigue Test-Bed Monitoring Based on the 2nd Harmonic of the Device Current Measurement. - Eleonora Ferraris; Irene Fassi; Biagio De Masi; Marco Del Sarto (ICMENS, 2005)

Out of plane vs in plane flexural behaviour of thin polysilicon films: Mechanical characterization and application of the Weibull approach. - Fabrizio Cacchione; Alberto Corigliano; Biagio De Masi; Caterina Riva (Microelectron. Reliab., 2005)

The effect of nano-scale interaction forces on the premature pull-in of real-life Micro-Electro-Mechanical Systems. - R. Ardito; Attilio Frangi; Alberto Corigliano; Biagio De Masi; G. Cazzaniga (Microelectron. Reliab., 2012)