Array Termination Impacts in Advanced SRAM. - Randy W. Mann; Sandeep Puri; Sheng Xie; Daniel Marienfeld; Joseph Versaggi; Bianzhu Fu; Michael Gribelyuk; Ratheesh R. Thankalekshmi; Xiaoqiang Zhang; Hui Zang; Chad E. Weintraub (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Effect of metal line width on electromigration of BEOL Cu interconnects. - Seungman Choi; Cathryn Christiansen; Linjun Cao; James Zhang; Ronald Filippi; Tian Shen; Kong Boon Yeap; Sean P. Ogden; Haojun Zhang; Bianzhu Fu; Patrick Justison (IRPS, 2018)