Not all Delay Tests Are the Same - SDQL Model Shows True-Time. - Anis Uzzaman; Mick Tegethoff; Bibo Li; Kevin McCauley; Shuji Hamada; Yasuo Sato (ATS, 2006)

Using Programmable On-Product Clock Generation (OPCG) for Delay Test. - Brion L. Keller; Anis Uzzaman; Bibo Li; Thomas J. Snethen (ATS, 2007)

Automated handling of programmable on-product clock generation (OPCG) circuitry for delay test vector generation. - Anis Uzzaman; Bibo Li; Thomas J. Snethen; Brion L. Keller; Gary Grise (ITC, 2007)