Improved low frequency noise characteristics of sub-micron MOSFETs with TaSiN/TiN gate on ALD HfO2 dielectric. - Siva Prasad Devireddy; Bigang Min; Zeynep Çelik-Butler; Hsing-Huang Tseng; Philip J. Tobin; Ania Zlotnicka (Microelectron. Reliab., 2007)