Transistor-Level Tools for High-End Processor Custom Circuit Design at IBM. - Karen Bard; Bill Dewey; Mei-Ting Hsu; Tom Mitchell 003; Karl Moody; Vasant Rao; Ron Rose; Jeff Soreff; Steve Washburn (Proc. IEEE, 2007)

Characterization, simulation, and modeling of FET source/drain diffusion resistance. - Ning Lu; Bill Dewey (CICC, 2008)

An efficient resistance sensitivity extraction algorithm for conductors of arbitrary shapes. - Tarek A. El-Moselhy; Ibrahim M. Elfadel; Bill Dewey (DAC, 2009)