Optimizing Boundary Scan in a Proprietary Environment. - William Eklow (ITC, 1994)

Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard. - Bulent I. Dervisoglu; Mike Ricchetti; William Eklow (ITC, 1998)

Unsafe board states during PC-based boundary-scan testing. - William Eklow; Richard M. Sedmak; Dan Singletary; Toai Vo (ITC, 2001)

Is Board Test Worth Talking About? - Bill Eklow (ITC, 2002)

IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. - Bill Eklow; Carl Barnhart; Kenneth P. Parker (ITC, 2002)

IEEE 1149.6 - A Practical Perspective. - Bill Eklow; Carl Barnhart; Mike Ricchetti; Terry Borroz (ITC, 2003)

IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. - Bill Eklow; Carl Barnhart; Kenneth P. Parker (IEEE Des. Test Comput., 2003)

IP Testing - The Future Differentiator? - Bill Eklow (DATE, 2004)

Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. - Stephen K. Sunter; Adam Osseiran; Adam Cron; Neil G. Jacobson; Dave Bonnett; Bill Eklow; Carl Barnhart; Ben Bennetts (DATE, 2004)

What Do You Mean My Board Test Stinks? - Bill Eklow (ITC, 2004)

Simulation Based System Level Fault Insertion Using Co-verification Tools. - Bill Eklow; Anoosh Hosseini; Chi Khuong; Shyam Pullela; Toai Vo; Hien Chau (ITC, 2004)

Realizing High Test Quality Goals with Smart Test Resource Usage. - Xinli Gu; Cyndee Wang; Abby Lee; Bill Eklow; Kun-Han Tsai; Jan Arild Tofte; Mark Kassab; Janusz Rajski (ITC, 2004)

"Real Life" System Testing of Networking Equipment. - Sunil Kalidindi; Nghia Huynh; Bill Eklow; Josh Goldstein (ITC, 2004)

A practical perspective on reducing ASIC NTFs. - Zoe Conroy; Geoff Richmond; Xinli Gu; Bill Eklow (ITC, 2005)

An update on IEEE 1149.6 - successes and issues. - Bill Eklow (ITC, 2005)

Optimized reasoning-based diagnosis for non-random, board-level, production defects. - Carlos O'Farrill; Merouane Moakil-Chbany; Bill Eklow (ITC, 2005)

IJTAG (internal JTAG): a step toward a DFT standard. - Jeff Rearick; Bill Eklow; Ken Posse; Al Crouch; Ben Bennetts (ITC, 2005)

New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG). - Bill Eklow; Ben Bennetts (ETS, 2006)

IEEE P1687: Toward Standardized Access of Embedded Instrumentation. - Ken Posse; Al Crouch; Jeff Rearick; Bill Eklow; Mike Laisne; Ben Bennetts; Jason Doege; Mike Ricchetti; Jean-Francois Cote (ITC, 2006)

Test Economics - What can a Board/System Test Engineer do to Influence Supply Operation Metrics. - Sylvain Tourangeau; Bill Eklow (ITC, 2006)

Parametric Testing of Optical Interfaces. - Brice Achkir; Pavel Zivny; Bill Eklow (ITC, 2008)

Embedded Testing in an In-Circuit Test Environment. - John Malian; Bill Eklow (ITC, 2008)

An Incremental Approach to Functional Diagnosis. - Luca Amati; Cristiana Bolchini; Laura Frigerio; Fabio Salice; William Eklow; Arnold Suvatne; Eugenio Brambilla; Federico Franzoso; Michele Martin (DFT, 2009)

Major Milestones for Two IEEE Standards Groups in 2011. - Bill Eklow (IEEE Des. Test Comput., 2011)

Yield enhancement for 3D-stacked ICs: Recent advances and challenges. - Qiang Xu 001; Li Jiang 002; Huiyun Li; Bill Eklow (ASP-DAC, 2012)

On effective TSV repair for 3D-stacked ICs. - Li Jiang 002; Qiang Xu 001; Bill Eklow (DATE, 2012)

Re-using chip level DFT at board level. - Xinli Gu; Jeff Rearick; Bill Eklow; Martin Keim; Jun Qian; Artur Jutman; Krishnendu Chakrabarty; Erik Larsson (ETS, 2012)

FALCON: Rapid statistical fault coverage estimation for complex designs. - Shahrzad Mirkhani; Jacob A. Abraham; Toai Vo; Hong Shin Jun; Bill Eklow (ITC, 2012)

Managing Complex Boundary-Scan Operations. - Bill Eklow (IEEE Des. Test Comput., 2012)

Post-bond Testing of the Silicon Interposer and Micro-bumps in 2.5D ICs. - Ran Wang 002; Krishnendu Chakrabarty; Bill Eklow (Asian Test Symposium, 2013)

On effective and efficient in-field TSV repair for stacked 3D ICs. - Li Jiang 002; Fangming Ye; Qiang Xu 001; Krishnendu Chakrabarty; Bill Eklow (DAC, 2013)

On Effective Through-Silicon Via Repair for 3-D-Stacked ICs. - Li Jiang 002; Qiang Xu 001; Bill Eklow (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013)

An All Digital Distributed Sensor Network Based Framework for Continuous Noise Monitoring and Timing Failure Analysis in SoCs. - Mehdi Sadi; Zoe Conroy; Bill Eklow; Matthias Kamm; Nematollah Bidokhti; Mark Mohammad Tehranipoor (ATS, 2014)

A distributed, reconfigurable, and reusable bist infrastructure for 3D-stacked ICs. - Mukesh Agrawal 001; Krishnendu Chakrabarty; Bill Eklow (ITC, 2014)

Protecting against emerging vmin failures in advanced technology nodes. - J. K. Jerry Lee; Amr Haggag; William Eklow (ITC, 2014)

Scan-Based Testing of Post-Bond Silicon Interposer Interconnects in 2.5-D ICs. - Ran Wang 002; Krishnendu Chakrabarty; Bill Eklow (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

No Fault Found: The root cause. - Erik Larsson; Bill Eklow; Scott Davidsson; Rob Aitken; Artur Jutman; Christophe Lotz (VTS, 2015)

Recap of the ITC15 Test Conference. - Bill Eklow (IEEE Des. Test, 2016)

A Distributed, Reconfigurable, and Reusable BIST Infrastructure for Test and Diagnosis of 3-D-Stacked ICs. - Mukesh Agrawal 001; Krishnendu Chakrabarty; Bill Eklow (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)