Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation. - Summer F. C. Tseng; Wei-Ting Kary Chien; Bing-Chu Cai (Microelectron. Reliab., 2003)

A cost-effective wafer-level reliability test system for integrated circuit makers. - Summer Fan-Chung Tseng; Wei-Ting Kary Chien; Excimer Gong; Bing-Chu Cai (IEEE Trans. Instrum. Meas., 2003)

Some practical considerations for effective and efficient wafer-level reliability control. - Summer F. C. Tseng; Wei-Ting Kary Chien; Excimer Gong; Willings Wang; Bing-Chu Cai (Microelectron. Reliab., 2004)

Fabrication and performance of novel RF spiral inductors on silicon. - Xi-Ning Wang; Xiao-Lin Zhao; Yong Zhou; Xu-Han Dai; Bing-Chu Cai (Microelectron. J., 2005)

Fabrication and performance of MEMS-based piezoelectric power generator for vibration energy harvesting. - Hua-Bin Fang; Jing-Quan Liu; Zheng-Yi Xu; Lu Dong; Li Wang 016; Di Chen; Bing-Chu Cai; Yue Liu (Microelectron. J., 2006)

A MEMS-based piezoelectric power generator array for vibration energy harvesting. - Jing-Quan Liu; Hua-Bin Fang; Zheng-Yi Xu; Xin-Hui Mao; Xiu-Cheng Shen; Di Chen; Hang Liao 002; Bing-Chu Cai (Microelectron. J., 2008)