Impact of interface nature on deep sub-micron Al-plug resistance. - Bing-Yue Tsui; Tsung-Ju Yang; Tzu-Kun Ku (Microelectron. Reliab., 2001)

A process for high yield and high performance carbon nanotube field effect transistors. - Tseng-Chin Lee; Bing-Yue Tsui; Pei-Jer Tzeng; Ching-Chiun Wang; Ming-Jinn Tsai (Microelectron. Reliab., 2010)

Multi-gate non-volatile memories with nanowires as charge storage material. - Bing-Yue Tsui; Pei-Yu Wang; Ting-Yeh Chen; Jung-Chien Cheng (Microelectron. Reliab., 2010)

Characteristics of size dependent conductivity of the CNT-interconnects formed by low temperature process. - Wei-Chih Chiu; Bing-Yue Tsui (Microelectron. Reliab., 2013)

High performance of CNT-interconnects by the multi-layer structure. - Wei-Chih Chiu; Bing-Yue Tsui (Microelectron. Reliab., 2014)

Photon-Detection-Probability Simulation Method for CMOS Single-Photon Avalanche Diodes. - Chin-An Hsieh; Chia-Ming Tsai; Bing-Yue Tsui; Bo-Jen Hsiao; Sheng-Di Lin (Sensors, 2020)

Investigation of Safe Operating Area on 4H-SiC 600V VDMOSFET with TLP and UIS Test Methods. - Chao-Yang Ke; Yu-Chia Tsui; Bing-Yue Tsui; Ming-Dou Ker (IRPS, 2023)