Work-in-Progress: High-Precision Short-Term Lifetime Prediction in TLC 3D NAND Flash Memory as Hot-data Storage. - Xiaotong Fang; Meng Zhang 014; Yifan Guo; Fei Chen; Binglu Chen; Xuepeng Zhan; Jixuan Wu; Fei Wu 005; Jiezhi Chen (CASES, 2022)

Large Suppression to Lateral Charge Migration (LCM) Related Error Bits in Charge-Trap TLC 3D NAND Flash. - Kenie Xie; Pena Guo; Fei Chen; Binglu Chen; Xiaotong Fang; Jixuan Wu; Xuepeng Zhan; Jiezhi Chen (ICTA, 2022)

High-Precision Short-Term Lifetime Prediction in TLC 3-D NAND Flash Memory as Hot-Data Storage. - Xiaotong Fang; Meng Zhang 014; Yifan Guo; Fei Chen; Binglu Chen; Xuepeng Zhan; Jixuan Wu; Fei Wu 005; Jiezhi Chen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)