Impact of within-wafer process variability on radiation response. - Zhiyuan Hu; Zhangli Liu; Hua Shao; Zhengxuan Zhang; Bingxu Ning; Ming Chen 007; Dawei Bi; Shichang Zou (Microelectron. J., 2011)

The impact of total ionizing radiation on body effect. - Bingxu Ning; Zhiyuan Hu; Zhengxuan Zhang; Zhangli Liu; Ming Chen 007; Dawei Bi; Shichang Zou (Microelectron. J., 2011)

Total ionizing dose effects in elementary devices for 180-nm flash technologies. - Zhiyuan Hu; Zhangli Liu; Hua Shao; Zhengxuan Zhang; Bingxu Ning; Ming Chen 007; Dawei Bi; Shichang Zou (Microelectron. Reliab., 2011)

Comparison of TID response in core, input/output and high voltage transistors for flash memory. - Zhangli Liu; Zhiyuan Hu; Zhengxuan Zhang; Hua Shao; Ming Chen 007; Dawei Bi; Bingxu Ning; Shichang Zou (Microelectron. Reliab., 2011)

Radiation-induced shallow trench isolation leakage in 180-nm flash memory technology. - Bingxu Ning; Zhengxuan Zhang; Zhangli Liu; Zhiyuan Hu; Ming Chen 007; Dawei Bi; Shichang Zou (Microelectron. Reliab., 2012)

Comprehensive study on the TID effects of 0.13 μm partially depleted SOI NMOSFETs. - Bingxu Ning; Dawei Bi; Huixiang Huang; Zhengxuan Zhang; Ming Chen 007; Shichang Zou (Microelectron. J., 2013)

Bias dependence of TID radiation responses of 0.13 μm partially depleted SOI NMOSFETs. - Bingxu Ning; Dawei Bi; Huixiang Huang; Zhengxuan Zhang; Zhiyuan Hu; Ming Chen 007; Shichang Zou (Microelectron. Reliab., 2013)

Total ionizing dose effect in 0.2 μm PDSOI NMOSFETs with shallow trench isolation. - Chao Peng; Zhiyuan Hu; Zhengxuan Zhang; Huixiang Huang; Bingxu Ning; Dawei Bi (Microelectron. Reliab., 2014)

Bias dependence of TID induced single transistor latch for 0.13 μm partially depleted SOI input/output NMOSFETs. - Shuang Fan; Bingxu Ning; Zhiyuan Hu; Zhengxuan Zhang; Dawei Bi; Chao Peng; Lei Song; Lihua Dai (Microelectron. Reliab., 2016)

Large-tilt Heavy Ions Induced SEU in Multiple Radiation Hardened 22 nm FDSOI SRAMs. - Chang Cai; Tianqi Liu; Jie Liu 032; Gengsheng Chen; Luchang Ding; Kai Zhao; Bingxu Ning; Mingjie Shen (IRPS, 2020)

Characterization and Classification of Heavy Ion Induced Failures in FPGA-based Logical Circuits. - Shuai Gao; Chang Cai; Bingxu Ning; Ze He; Jie Liu 032 (ASICON, 2021)

SEU sensitivity and large spacing TMR efficiency of Kintex-7 and Virtex-7 FPGAs. - Chang Cai; Bingxu Ning; Xue Fan; Tianqi Liu; Lingyun Ke; Gengsheng Chen; Jian Yu; Ze He; Liewei Xu; Jie Liu 032 (Sci. China Inf. Sci., 2022)