The scattering fields of 2-D sea fractal surface with finite conductivity illuminated by ellipse polarization wave. Part two. Scattering matrix and numerical results. - Xie Tao 002; Yijun He; Binhong Li; Wenjun Chen (IGARSS, 2004)

The scattering fields of 2-D sea fractal surface with finite conductivity illuminated by ellipse polarization wave. Part One. Scattering fields in Cartesian coordinates. - Xie Tao 002; Binhong Li; Wenjun Chen; Yijun He (IGARSS, 2004)

Ageing effect on electromagnetic susceptibility of a phase locked loop. - Binhong Li; Alexandre Boyer; Sonia Bendhia; Christophe Lemoine (Microelectron. Reliab., 2010)

Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout. - Néstor Berbel; Raúl Fernández-García; Ignacio Gil; Binhong Li; Alexandre Boyer; Sonia Bendhia (Microelectron. Reliab., 2011)

Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences. - Binhong Li; Néstor Berbel; Alexandre Boyer; Sonia Bendhia; Raúl Fernández-García (Microelectron. Reliab., 2011)

Prediction of Long-term Immunity of a Phase-Locked Loop. - Alexandre Boyer; Sonia Ben Dhia; Binhong Li; Christophe Lemoine; Bertrand Vrignon (J. Electron. Test., 2012)

Electromagnetic susceptibility characterization of double SOI device. - Binhong Li; Kai Zhao; Jianfei Wu; Xing Zhao; Jianwei Su; Jiantou Gao; Chuang Gao; Jun Luo 002 (Microelectron. Reliab., 2016)

Microcontroller susceptibility variations to EFT burst during accelerated aging. - Jianfei Wu; Chuangwei Li; Binhong Li; Wei Zhu; Hongyi Wang 003 (Microelectron. Reliab., 2016)

Investigations on the EFT immunity of microcontrollers with different architectures. - Jianfei Wu; Binhong Li; W. Zhu; H. Wang; L. Zheng (Microelectron. Reliab., 2017)

The Design Method of the Active Negative Group Delay Circuits Based on a Microwave Amplifier and an RL-Series Network. - Fayu Wan; Ningdong Li; Blaise Ravelo; Qizheng Ji; Binhong Li; Junxiang Ge (IEEE Access, 2018)

Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment. - Binhong Li; Yang Huang 002; Jianfei Wu; Yunbo Huang; Bo Li 051; Qingzhu Zhang; Ling Yang; Fayu Wan; Jiajun Luo; Zhengsheng Han; Huaxiang Yin (Microelectron. Reliab., 2018)

Process variation dependence of total ionizing dose effects in bulk nFinFETs. - Bo Li 051; Yunbo Huang; Ling Yang; Qingzhu Zhang; Zhongshan Zheng; Binhong Li; Huiping Zhu; Jianhui Bu; Huaxiang Yin; Jiajun Luo; Zhengsheng Han; Haibin Wang (Microelectron. Reliab., 2018)

The total ionizing dose response of leading-edge FDSOI MOSFETs. - Jian Wang; Binhong Li; Yang Huang 002; Kai Zhao; Fang Yu; Qiwen Zheng; Qi Guo 007; Liewei Xu; J. Gao; X. Cai; Y. Cui (Microelectron. Reliab., 2018)

Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory. - Jianfei Wu; Wei Zhu; Binhong Li; Yafei Li; Hongyi Wang 003; Mengjun Wang (Microelectron. Reliab., 2018)

Negative Group Delay Theory of a Four-Port RC-Network Feedback Operational Amplifier. - Fayu Wan; Taocheng Gu; Blaise Ravelo; Binhong Li; Jing Cheng; Qingyun Yuan; Junxiang Ge (IEEE Access, 2019)

Time-Domain Experimentation of NGD ActiveRC-Network Cell. - Fayu Wan; Ningdong Li; Blaise Ravelo; Junxiang Ge; Binhong Li (IEEE Trans. Circuits Syst. II Express Briefs, 2019)

S-Matrix and Bandpass Negative Group Delay Innovative Theory of Ti-Geometrical Shape Microstrip Structure. - Xiang Zhou; Taochen Gu; Lili Wu; Fayu Wan; Binhong Li; Nour Mohammad Murad; Sébastien Lalléchère; Blaise Ravelo (IEEE Access, 2020)

Analytical Design of Dual-Band Negative Group Delay Circuit With Multi-Coupled Lines. - Xiang Zhou; Binhong Li; Ningdong Li; Blaise Ravelo; Xiaofeng Hu; Qizheng Ji; Fayu Wan; Glauco Fontgalland (IEEE Access, 2020)

Examining the Thermal Stress Effect of Electromagnetic Susceptibility of Automotive CAN Controller. - Jianfei Wu; Xiangqian Li; Binhong Li; Yong Xie; Mengjun Wang (J. Circuits Syst. Comput., 2021)

Design and Experimentation of Inductorless Low-Pass NGD Integrated Circuit in 180-nm CMOS Technology. - Fayu Wan; Taochen Gu; Binhong Li; Bo Li 051; Wenceslas Rahajandraibe; Mathieu Guerin; Sébastien Lalléchère; Blaise Ravelo (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Anole: A Lightweight and Verifiable Learned-Based Index for Time Range Query on Blockchain Systems. - Jian Chang; Binhong Li; Jiang Xiao; Licheng Lin; Hai Jin 001 (DASFAA (1), 2023)

A Portfolio Selection Strategy Based on the Peak Price Involving Randomness. - Binhong Li; Jiaxi Luo; Hongjie Xu (IEEE Access, 2023)

T-Topology Coupler-Based Bandpass Negative Group Delay Active Circuit Design and Test. - Taochen Gu; Fayu Wan; Jingjie Zhou; Qizheng Ji; Binhong Li; Blaise Ravelo (IEEE Des. Test, 2023)

A two-stage slicer employing body biasing for 64-Gb/s PAM4 wireline receiver in 22-nm FDSOI technology. - Ai He; Binhong Li; Jianzhong Li; Xing Zhao; Jincai Guo; Jianping Wang; Xiangqian Zeng; Yun Wang; Tianchun Ye 001; Quan Xue (Microelectron. J., 2024)

Cloak: Hiding Retrieval Information in Blockchain Systems via Distributed Query Requests. - Jiang Xiao; Jian Chang; Licheng Lin; Binhong Li; Xiaohai Dai; Zehui Xiong; Kim-Kwang Raymond Choo; Keke Gai; Hai Jin 001 (IEEE Trans. Serv. Comput., 2024)

Using Fuzzy C-Means Clustering to Determine First Arrival of Microseismic Recordings. - Xiangyun Zhao; Haihang Chen; Binhong Li; Zhen Yang 027; Huailiang Li (Sensors, 2024)

Intelligent coal gangue identification: A novel amplitude frequency sensitive neural network. - Zipeng Zhang; Zhencai Zhu; Bin Meng; Zheng Yang; Mingke Wu; Xinyu Cheng; Binhong Li; Houguang Liu (Expert Syst. Appl., 2025)

Novel empirical curvelet denoising strategy for suppressing mixed noise of microseismic data. - Liyuan Feng; Binhong Li; Huailiang Li; Jian He (Comput. Geosci., 2025)

Low-phase-noise wideband dual-core quad-mode VCO using a mode-switching transformer. - Shaofeng Tan; Xing Zhao; Chao Li; Binhong Li; Jianzhong Li; Tianchun Ye 001; Bo Gao; Jun Luo (Microelectron. J., 2025)

Compression Hacking: A Supplementary Perspective on Informatics Metric of Language Models from Geometric Distortion. - Jianxiang Zang; Meiling Ning; Yongda Wei; Shihan Dou; Jiazheng Zhang; Nijia Mo; Binhong Li; Tao Gui; Qi Zhang 001; Xuanjing Huang 001 (CoRR, 2025)

FlexIM: Efficient and Verifiable Index Management in Blockchain. - Binhong Li; Licheng Lin; Shijie Zhang; Jianliang Xu; Jiang Xiao; Bo Li 001; Hai Jin 001 (IEEE Trans. Knowl. Data Eng., 2025)