Novel Strategies for Highly Uniform and Reliable Cell Characteristics of 8th Generation 1Tb 3D-NAND Flash Memory. - Changhwan Lee; Min-Tai Yu; Sejun Park; Hoki Lee; Bio Kim; Suhwan Lim; Jaeduk Lee; Sung-Hun Lee; Mincheol Park; Sujin Ahn; Sunghoi Hur (VLSI Technology and Circuits, 2023)