The Effects of Backdrive Stressing Fast IC Technologies. - Birger Schneider; Gert Jørgensen; Mogens B. Christensen (ITC, 1986)

An Advanced Data Compaction Approach for Test During Burn-In. - Birger Schneider; Peter Oestergaard (ITC, 1988)

IntegraTEST: The New Wave in Mixed-Signal Test. - Birger Schneider; Soeren Soegaard (ITC, 1995)

ADMIRE: advanced mixed signal design environment. - Philippe Reynaert; Ludwig G. A. Callewaert; Georges G. E. Gielen; Geert Debyser; Koen Lampaert; Francky Leyn; Geert Van der Plas; Willy Sansen; Birger Schneider; René Bloch; Dave Orton; Steve Boardman; et al. (ICECS, 1996)