Flexible test mode approach for 256-Mb DRAM. - Toshiaki Kirihata; Hing Wong; John K. DeBrosse; Yohji Watanabe; Takahiko Hara; Munehiro Yoshida; Matthew R. Wordeman; Shuso Fujii; Yoshiaki Asao; Bo Krsnik (IEEE J. Solid State Circuits, 1997)