Low Current and Low Voltages-The High-End OP AMP Testing Challenge. - Bob Cometta; Jan Witte (ITC, 1997)

Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. - Ramakrishna Voorakaranam; Randy Newby; Sasikumar Cherubal; Bob Cometta; Thomas Kuehl; David M. Majernik; Abhijit Chatterjee (ITC, 2003)