IC laser trimming speed-up through wafer-level spatial correlation modeling. - Constantinos Xanthopoulos; Ke Huang 001; Abbas Poonawala; Amit Nahar; Bob Orr; John M. Carulli Jr.; Yiorgos Makris (ITC, 2014)

Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion. - Ali Ahmadi; Haralampos-G. D. Stratigopoulos; Amit Nahar; Bob Orr; Michael Pas; Yiorgos Makris (ICCAD, 2015)

Yield prognosis for fab-to-fab product migration. - Ali Ahmadi; Ke Huang 001; Amit Nahar; Bob Orr; Michael Pas; John M. Carulli; Yiorgos Makris (VTS, 2015)

A machine learning approach to fab-of-origin attestation. - Ali Ahmadi; Mohammad-Mahdi Bidmeshki; Amit Nahar; Bob Orr; Michael Pas; Yiorgos Makris (ICCAD, 2016)

Harnessing fabrication process signature for predicting yield across designs. - Ali Ahmadi; Haralampos-G. D. Stratigopoulos; Amit Nahar; Bob Orr; Michael Pas; Yiorgos Makris (ISCAS, 2016)

Harnessing process variations for optimizing wafer-level probe-test flow. - Ali Ahmadi; Constantinos Xanthopoulos; Amit Nahar; Bob Orr; Michael Pas; Yiorgos Makris (ITC, 2016)

Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs. - Ali Ahmadi; Amit Nahar; Bob Orr; Michael Pas; Yiorgos Makris (VTS, 2016)

Wafer-level adaptive trim seed forecasting based on E-tests. - Constantinos Xanthopoulos; Ali Ahmadi; Sirish Boddikurapati; Amit Nahar; Bob Orr; Yiorgos Makris (ISCAS, 2017)

Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. - Ali Ahmadi; Haralampos-G. D. Stratigopoulos; Ke Huang 001; Amit Nahar; Bob Orr; Michael Pas; John M. Carulli; Yiorgos Makris (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017)