A technique for low power, stuck-at fault diagnosable and reconfigurable scan architecture. - Binod Kumar 001; Boda Nehru; Brajesh Pandey; Virendra Singh; Jaynarayan T. Tudu (EWDTS, 2016)

Skip-scan: A methodology for test time reduction. - Binod Kumar 001; Boda Nehru; Brajesh Pandey; Jaynarayan T. Tudu (VDAT, 2016)