An accurate and scalable MOSFET aging model for circuit simulation. - Bogdan Tudor; Joddy Wang; Zhaoping Chen; Robin Tan; Weidong Liu; Frank Lee 003 (ISQED, 2011)

An accurate MOSFET aging model for 28 nm integrated circuit simulation. - Bogdan Tudor; Joddy Wang; Zhaoping Chen; Robin Tan; Weidong Liu; Frank Lee 003 (Microelectron. Reliab., 2012)