Fast Digital TRNG Based on Metastable Ring Oscillator. - Ihor V. Vasyltsov; Eduard Hambardzumyan; Young-Sik Kim; Bohdan Karpinskyy (CHES, 2008)

8.7 Physically unclonable function for secure key generation with a key error rate of 2E-38 in 45nm smart-card chips. - Bohdan Karpinskyy; Yongki Lee; Yunhyeok Choi; Yongsoo Kim; Mijung Noh; Sanghyun Lee (ISSCC, 2016)

27.4 Physically Unclonable Function in 28nm FD801 Technology Achieving High Reliability for AEC-Q100 Grade 1 and 1SO26262 ASIL-B. - Yunhyeok Choi; Bohdan Karpinskyy; Kyoung-Moon Ahn; Yongsoo Kim; Soonkwan Kwon; Jieun Park; Yongki Lee; Mijung Noh (ISSCC, 2020)

Samsung Physically Unclonable Function (SAMPUF™) and its integration with Samsung Security System. - Yongki Lee; Bohdan Karpinskyy; Yunhyeok Choi; Kyoung-Moon Ahn; Yongsoo Kim; Jieun Park; Sumin Noh; Jisu Kang; Jonghoon Shin; Jaechul Park; Youngjin Chung; Jongshin Shin (CICC, 2021)

16.8 A 60Mb/s TRNG with PVT-Variation-Tolerant Design Based on STR in 4nm. - Jieun Park; Yong Ki Lee; Bohdan Karpinskyy; Yunhyeok Choi; Jonghoon Shin; Hyo-Gyuem Rhew; Jongshin Shin (ISSCC, 2024)

An Efficient Vth-Tilting PUF Design in 3nm GAA and 8nm FinFET Technologies. - Bohdan Karpinskyy; Yong Ki Lee; Sumin Noh; Yunhyeok Choi; Jieun Park; Jisu Kang; Taewook Park; Eunhye Oh; Gapkyung Kim; Sungha Lee; Hyunwoo Ko; Jonghoon Shin; et al. (ISSCC, 2025)