Design of scan-testable CMOS sequential circuits. - Bong-Hee Park; Premachandran R. Menon (ITC, 1990)

Robustly Scan-Testable CMOS Sequential Circuits. - Bong-Hee Park; Premachandran R. Menon (ITC, 1991)

Stuck-open testable scan-based CMOS sequential circuits. - Bong-Hee Park; Premachandran R. Menon (IEEE J. Solid State Circuits, 1992)

Divergence and scheduling in functional level concurrent fault simulation. - O. Y. Song; Bong-Hee Park; Prem R. Menon (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993)