Aging-Aware Design Verification Methods Under Real Product Operating Conditions. - Hyewon Shim; Jeongmin Jo; Yoohwan Kim; Bongyong Jeong; Minji Shon; Hai Jiang 005; Sangwoo Pae (IRPS, 2019)

An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced FinFET Technology. - Sangmin Oh; Taeyoung Jeong; Junghwan Yum; Minhyuk Lim; Yoohwan Kim; Bongyong Jeong; Jeongmin Jo; Hyewon Shim; Shin-Young Chung; Paul Jung (IRPS, 2024)