Identifying failure mechanisms in LDMOS transistors by analytical stability analysis. - Alessandro Ferrara; Peter G. Steeneken; Boni K. Boksteen; Anco Heringa; Andries J. Scholten; Jurriaan Schmitz; Raymond J. E. Hueting (ESSDERC, 2014)

Impact of the collector structure on the performance of the insulated gate bipolar transistor. - Jeroen van Zoeren; Gaurav Gupta; Boni K. Boksteen; Lis K. Nanver; Raymond J. E. Hueting (Microelectron. J., 2025)