Improved Stability of Large Area Excimer Laser Crstallised Polysilicon Thin Film Transistors under DC and AC Operating. - Hamid Toutah; Jean-François Llibre; Boubekeur Tala-Ighil; Taieb Mohammed-Brahim; Youri Helen; G. Gautier; Olivier Bonnaud (Microelectron. Reliab., 2001)

Degradation in polysilicon thin film transistors related to the quality of the polysilicon material. - Hamid Toutah; Boubekeur Tala-Ighil; Jean-François Llibre; Bertrand Boudart; Taieb Mohammed-Brahim; Olivier Bonnaud (Microelectron. Reliab., 2003)

Comparison Between the Behaviour of Punch-Through and Non-Punch-Through Insulated Gate Bipolar Transistors Under High Temperature Reverse Bias Stress. - Cheick Oumar Maïga; Hamid Toutah; Boubekeur Tala-Ighil; Bertrand Boudart (Microelectron. Reliab., 2004)

Trench insulated gate bipolar transistors submitted to high temperature bias stress. - Cheick Oumar Maïga; Hamid Toutah; Boubekeur Tala-Ighil; Bertrand Boudart (Microelectron. Reliab., 2005)

Supercapacitor ageing at constant temperature and constant voltage and thermal shock. - Hamid Gualous; Roland Gallay; G. Alcicek; Boubekeur Tala-Ighil; Amrane Oukaour; Bertrand Boudart; Philippe Makany (Microelectron. Reliab., 2010)

Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature. - M. Tounsi; Amrane Oukaour; Boubekeur Tala-Ighil; Hamid Gualous; Bertrand Boudart; Djamil Aïssani (Microelectron. Reliab., 2010)

Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition. - Amrane Oukaour; Boubekeur Tala-Ighil; Bertrand Pouderoux; M. Tounsi; M. Bouarroudj-Berkani; Stéphane Lefebvre; Bertrand Boudart (Microelectron. Reliab., 2011)

Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour. - Boubekeur Tala-Ighil; Amrane Oukaour; Hamid Gualous; Bertrand Boudart; Bertrand Pouderoux; Jean-Lionel Trolet; Marc Piccione (Microelectron. Reliab., 2011)

Calendar and cycling ageing of activated carbon supercapacitor for automotive application. - Hamid Gualous; Roland Gallay; Monzer Al Sakka; Amrane Oukaour; Boubekeur Tala-Ighil; Bertrand Boudart (Microelectron. Reliab., 2012)

Supercapacitors aging diagnosis using least square algorithm. - Amrane Oukaour; Mathieu Pouliquen; Boubekeur Tala-Ighil; Hamid Gualous; Eric Pigeon; Olivier Gehan; Bertrand Boudart (Microelectron. Reliab., 2013)

Experimental and comparative study of gamma radiation effects on Si-IGBT and SiC-JFET. - Boubekeur Tala-Ighil; Jean-Lionel Trolet; Hamid Gualous; Philippe Mary; Stéphane Lefebvre (Microelectron. Reliab., 2015)