Full reliability characterization of three-terminal SOT-MTJ devices and corresponding arrays. - Xinyi Xu; Hongchao Zhang; Chuanpeng Jiang; Jinhao Li 007; Shiyang Lu; Yunpeng Li; Honglei Du; Xueying Zhang; Zhaohao Wang; Kaihua Cao; Weisheng Zhao; Shuqin Lyu; et al. (IRPS, 2023)

Process optimization and cryogenic evaluation of spin-orbit torque magnetic random access memory. - Zhongkui Zhang; Xiaofei Fan; Danrong Xiong; Huiyan Sun; Xiantao Shang; Bowen Man; Cong Zhang; Shuhui Li; Renjie Su; Chengyuan Sun; Jennifer Zhou; Hongxi Liu; et al. (IMW, 2024)