Conflict driven scan chain configuration for high transition fault coverage and low test power. - Zhen Chen; Boxue Yin; Dong Xiang (ASP-DAC, 2009)

Compact Test Generation for Small-Delay Defects Using Testable-Path Information. - Dong Xiang; Boxue Yin; Krishnendu Chakrabarty (Asian Test Symposium, 2009)

A power-effective scan architecture using scan flip-flops clustering and post-generation filling. - Zhen Chen; Dong Xiang; Boxue Yin (ACM Great Lakes Symposium on VLSI, 2009)

New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets. - Boxue Yin; Dong Xiang; Zhen Chen (VLSI Design, 2009)

The ATPG Conflict-Driven Scheme for High Transition Fault Coverage and Low Test Cost. - Zhen Chen; Dong Xiang; Boxue Yin (VTS, 2009)

Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure. - Dong Xiang; Boxue Yin; Kwang-Ting Cheng (VTS, 2009)

Scan chain configuration based X-filling for low power and high quality testing. - Zhen Chen; J. Feng; Dong Xiang; Boxue Yin (IET Comput. Digit. Tech., 2010)

Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing. - Dong Xiang; Wenjie Sui; Boxue Yin; Kwang-Ting Cheng (IEEE Trans. Very Large Scale Integr. Syst., 2014)

Read Consistency in Distributed Database Based on DMVCC. - Jie Shao; Boxue Yin; Bujiao Chen; Guangshu Wang; Lin Yang; Jianliang Yan; Jianying Wang; Weidong Liu (HiPC, 2016)

Leveraging Page-Level Compression in MySQL - A Practice at Baidu. - Jingwei Ma; Boxue Yin; Zhi Kong; Yuxiang Ma; Chang Chen; Long Wang; Gang Wang 001; Xiaoguang Liu 001 (Trustcom/BigDataSE/ISPA, 2016)

OceanBase: A 707 Million tpmC Distributed Relational Database System. - Zhenkun Yang; Chuanhui Yang; Fusheng Han; Mingqiang Zhuang; Bing Yang; Zhifeng Yang; Xiaojun Cheng; Yuzhong Zhao; Wenhui Shi; Huafeng Xi; Huang Yu; Bin Liu; et al. (Proc. VLDB Endow., 2022)