On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. - Jennifer Dworak; Michael R. Grimaila; Brad Cobb; Ting-Chi Wang; Li-C. Wang; M. Ray Mercer (Asian Test Symposium, 2000)

A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults. - Sooryong Lee; Brad Cobb; Jennifer Dworak; Michael R. Grimaila; M. Ray Mercer (DATE, 2002)

Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults. - Jennifer Dworak; James Wingfield; Brad Cobb; Sooryong Lee; Li-C. Wang; M. Ray Mercer (DFT, 2002)

Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects. - Jennifer Dworak; Brad Cobb; James Wingfield; M. Ray Mercer (DATE, 2004)