Embedded Boundary Scan. - Bradford G. Van Treuren; José M. Miranda (IEEE Des. Test Comput., 2003)

JTAG-based vector and chain management for system test. - Bradford G. Van Treuren; Bryan E. Peterson; José M. Miranda (ITC, 2005)

A practical approach to comprehensive system test & debug using boundary scan based test architecture. - Tapan J. Chakraborty; Chen-Huan Chiang; Bradford G. Van Treuren (ITC, 2007)

JTAG system test in a MicroTCA world. - Bradford G. Van Treuren; Adam W. Ley (ITC, 2007)

A New Language Approach for IJTAG. - Michele Portolan; Suresh Goyal; Bradford G. Van Treuren; Chen-Huan Chiang; Tapan J. Chakraborty; Thomas B. Cook (ITC, 2008)

System JTAG Initiative Group Advancements. - Bradford G. Van Treuren (ITC, 2008)

Problems Using Boundary-Scan for Memory Cluster Tests. - Bradford G. Van Treuren; Chen-Huan Chiang; Kenneth Honaker (ITC, 2008)

Scalable and efficient integrated test architecture. - Michele Portolan; Suresh Goyal; Bradford G. Van Treuren (ITC, 2009)

Scan chain securization though Open-Circuit Deadlocks. - Michele Portolan; Bradford G. Van Treuren; Suresh Goyal (ITC, 2010)

A Common Language Framework for Next-Generation Embedded Testing. - Michele Portolan; Suresh Goyal; Bradford G. Van Treuren; Chen-Huan Chiang; Tapan J. Chakraborty; Thomas B. Cook (IEEE Des. Test Comput., 2010)

Executing IJTAG: Are Vectors Enough? - Michele Portolan; Bradford G. Van Treuren; Suresh Goyal (IEEE Des. Test, 2013)

Modeling Novel Non-JTAG IEEE 1687-Like Architectures. - Mike Laisne; Alfred L. Crouch; Michele Portolan; Martin Keim; Hans Martin von Staudt; M. Abdalwahab; Bradford G. Van Treuren; Jeff Rearick (ITC, 2020)

Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces. - Hans Martin von Staudt; Bradford G. Van Treuren; Jeff Rearick; Michele Portolan; Martin Keim (ETS, 2021)

IEEE P1687.1: Extending the Network Boundaries for Test. - Michael Laisne; Alfred L. Crouch; Michele Portolan; Martin Keim; Hans Martin von Staudt; Bradford G. Van Treuren; Jeff Rearick; Songlin Zuo (ITC, 2022)