Impact of Multiple-Detect Test Patterns on Product Quality. - Brady Benware; Chris Schuermyer; Sreenevasan Ranganathan; Robert Madge; Prabhu Krishnamurthy; Nagesh Tamarapalli; Kun-Han Tsai; Janusz Rajski (ITC, 2003)

Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. - Chris Schuermyer; Brady Benware; Kevin Cota; Robert Madge; W. Robert Daasch; L. Ning (ITC, 2003)

Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. - Brady Benware; Robert Madge; Cam Lu; W. Robert Daasch (VTS, 2003)

Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. - Robert Madge; Brady Benware; W. Robert Daasch (IEEE Des. Test Comput., 2003)

Achieving Sub 100 DPPM Defect Levels on VDSM and Nanometer ASICs. - Brady Benware (ITC, 2004)

Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. - Brady Benware; Cam Lu; John Van Slyke; Prabhu Krishnamurthy; Robert Madge; Martin Keim; Mark Kassab; Janusz Rajski (ITC, 2004)

In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. - Robert Madge; Brady Benware; Ritesh P. Turakhia; W. Robert Daasch; Chris Schuermyer; Jens Ruffler (ITC, 2004)

Detection of Temperature Sensitive Defects Using ZTC. - Ethan Long; W. Robert Daasch; Robert Madge; Brady Benware (VTS, 2004)

Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC. - Joel Lurkins; DeAnna Hill; Brady Benware (ITC, 2005)

The value of statistical testing for quality, yield and test cost improvement. - Robert Madge; Brady Benware; Mark Ward; W. Robert Daasch (ITC, 2005)

Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. - Chris Schuermyer; Kevin Cota; Robert Madge; Brady Benware (ITC, 2005)

Defect Screening Using Independent Component Analysis on I_DDQ. - Ritesh P. Turakhia; Brady Benware; Robert Madge; Thaddeus T. Shannon; W. Robert Daasch (VTS, 2005)

A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. - Martin Keim; Nagesh Tamarapalli; Huaxing Tang; Manish Sharma; Janusz Rajski; Chris Schuermyer; Brady Benware (ITC, 2006)

Extracting Defect Density and Size Distributions from Product ICs. - Jeffrey E. Nelson; Thomas Zanon; Jason G. Brown; Osei Poku; R. D. (Shawn) Blanton; Wojciech Maly; Brady Benware; Chris Schuermyer (IEEE Des. Test Comput., 2006)

Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. - Ritesh P. Turakhia; W. Robert Daasch; Joel Lurkins; Brady Benware (IEEE Des. Test Comput., 2006)

Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. - Huaxing Tang; Manish Sharma; Janusz Rajski; Martin Keim; Brady Benware (ETS, 2007)

Silicon Evaluation of Static Alternative Fault Models. - Chris Schuermyer; Jewel Pangilinan; Jay Jahangiri; Martin Keim; Janusz Rajski; Brady Benware (VTS, 2007)

Enhancing Transition Fault Model for Delay Defect Diagnosis. - Wu-Tung Cheng; Brady Benware; Ruifeng Guo; Kun-Han Tsai; Takeo Kobayashi; Kazuyuki Maruo; Michinobu Nakao; Yoshiaki Fukui; Hideyuki Otake (ATS, 2008)

Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. - Manish Sharma; Brady Benware; Lei Ling; David Abercrombie; Lincoln Lee; Martin Keim; Huaxing Tang; Wu-Tung Cheng; Ting-Pu Tai; Yi-Jung Chang; Reinhart Lin; Albert Mann (ITC, 2008)

Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study. - Ritesh P. Turakhia; Mark Ward; Sandeep Kumar Goel; Brady Benware (VTS, 2009)

Case study of scan chain diagnosis and PFA on a low yield wafer. - Yu Huang 005; Brady Benware; Wu-Tung Cheng; Ting-Pu Tai; Feng-Ming Kuo; Yuan-Shih Chen (ITC, 2010)

Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis. - Manish Sharma; Chris Schuermyer; Brady Benware (IEEE Des. Test Comput., 2010)

On Using Design Partitioning to Reduce Diagnosis Memory Footprint. - Xiaoxin Fan; Huaxing Tang; Sudhakar M. Reddy; Wu-Tung Cheng; Brady Benware (Asian Test Symposium, 2011)

Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. - Brady Benware; Grzegorz Mrugalski; Artur Pogiel; Janusz Rajski; Jedrzej Solecki; Jerzy Tyszer (ETS, 2011)

A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores. - Manish Sharma; Avijit Dutta; Wu-Tung Cheng; Brady Benware; Mark Kassab (ITC, 2011)

Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. - Brady Benware; Grzegorz Mrugalski; Artur Pogiel; Janusz Rajski; Jedrzej Solecki; Jerzy Tyszer (J. Electron. Test., 2011)

Improved volume diagnosis throughput using dynamic design partitioning. - Xiaoxin Fan; Huaxing Tang; Yu Huang 005; Wu-Tung Cheng; Sudhakar M. Reddy; Brady Benware (ITC, 2012)

Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results. - Brady Benware; Chris Schuermyer; Manish Sharma; Thomas Herrmann (IEEE Des. Test Comput., 2012)

Distributed dynamic partitioning based diagnosis of scan chain. - Yu Huang 005; Xiaoxin Fan; Huaxing Tang; Manish Sharma; Wu-Tung Cheng; Brady Benware; Sudhakar M. Reddy (VTS, 2013)

Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models. - Huaxing Tang; Brady Benware; Michael Reese; Joseph Caroselli; Thomas Herrmann; Friedrich Hapke; Robert Tao; Wu-Tung Cheng; Manish Sharma (ATS, 2014)

Innovative practices session 2C: Advanced in yield learning. - Yen-Tzu Lin; Brady Benware; Brian Stine; Azeez Bhavnagarwala (VTS, 2014)

Diagnosing timing related cell internal defects for FinFET technology. - Huaxing Tang; Ting-Pu Tai; Wu-Tung Cheng; Brady Benware; Friedrich Hapke (VLSI-DAT, 2015)

Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data. - Wu-Tung Cheng; Randy Klingenberg; Brady Benware; Wu Yang; Manish Sharma; Geir Eide; Yue Tian; Sudhakar M. Reddy; Yan Pan; Sherwin Fernandes; Atul Chittora (ATS, 2017)

Scan Chain Diagnosis Based on Unsupervised Machine Learning. - Yu Huang 005; Brady Benware; Randy Klingenberg; Huaxing Tang; Jayant Dsouza; Wu-Tung Cheng (ATS, 2017)

Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests. - Naixing Wang; Irith Pomeranz; Brady Benware; M. Enamul Amyeen; Srikanth Venkataraman (DFT, 2018)