Transient current testing of 0.25 μm CMOS devices. - Bram Kruseman; Peter Janssen; Victor Zieren (ITC, 1999)

Comparison of defect detection capabilities of current-based and voltage-based test methods. - Bram Kruseman (ETW, 2000)

The future of delta I_DDQ testing. - Bram Kruseman; Rudger van Veen; Kees van Kaam (ITC, 2001)

Comparison of IDDQ Testing and Very-Low Voltage Testing. - Bram Kruseman; Stefan van den Oetelaar; Josep Rius 001 (ITC, 2002)

Detection of Resistive Shorts in Deep Sub-micron Technologies. - Bram Kruseman; Stefan van den Oetelaar (ITC, 2003)

On Hazard-free Patterns for Fine-delay Fault Testing. - Bram Kruseman; Ananta K. Majhi; Guido Gronthoud; Stefan Eichenberger (ITC, 2004)

Systematic Defects in Deep Sub-Micron Technologies. - Bram Kruseman; Ananta K. Majhi; Camelia Hora; Stefan Eichenberger; Johan Meirlevede (ITC, 2004)

Trends in Testing Integrated Circuits. - Bart Vermeulen; Camelia Hora; Bram Kruseman; Erik Jan Marinissen; Robert Van Rijsinge (ITC, 2004)

On test conditions for the detection of open defects. - Bram Kruseman; Manuel Heiligers (DATE, 2006)

Power Supply Noise in Delay Testing. - Jing Wang 006; D. M. H. Walker; Ananta K. Majhi; Bram Kruseman; Guido Gronthoud; Luis Elvira Villagra; Paul van de Wiel; Stefan Eichenberger (ITC, 2006)

Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman; Maurice Lousberg; Ananta K. Majhi (VTS, 2007)

On Performance Testing with Path Delay Patterns. - Bram Kruseman; Ananta K. Majhi; Guido Gronthoud (VTS, 2007)

Diagnosis of Full Open Defects in Interconnecting Lines. - Rosa Rodríguez-Montañés; Daniel Arumí; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman; Maurice Lousberg; Ananta K. Majhi (VTS, 2007)

Modeling Power Supply Noise in Delay Testing. - Jing Wang 006; Duncan M. Hank Walker; Xiang Lu; Ananta K. Majhi; Bram Kruseman; Guido Gronthoud; Luis Elvira Villagra; Paul J. A. M. van de Wiel; Stefan Eichenberger (IEEE Des. Test Comput., 2007)

Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality. - Stefan Eichenberger; Jeroen Geuzebroek; Camelia Hora; Bram Kruseman; Ananta K. Majhi (ITC, 2008)

Time-dependent Behaviour of Full Open Defects in Interconnect Lines. - Rosa Rodríguez-Montañés; Daniel Arumí; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (ITC, 2008)

Full Open Defects in Nanometric CMOS. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (VTS, 2008)

NIM- a noise index model to estimate delay discrepancies between silicon and simulation. - Elif Alpaslan; Jennifer Dworak; Bram Kruseman; Ananta K. Majhi; Wilmar M. Heuvelman; Paul van de Wiel (DATE, 2010)

Diagnosis of full open defects in interconnect lines with fan-out. - Rosa Rodríguez-Montañés; Daniel Arumí; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (ETS, 2010)

Impact of Temperature on Test Quality. - Lavanya Jagan; Camelia Hora; Bram Kruseman; Stefan Eichenberger; Ananta K. Majhi; V. Kamakoti 001 (VLSI Design, 2010)

Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. - Hamidreza Hashempour; Jos Dohmen; Bratislav Tasic; Bram Kruseman; Camelia Hora; Maikel van Beurden; Yizi Xing (DATE, 2011)

A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices. - Nivesh Rai; Hamidreza Hashempour; Yizi Xing; Bram Kruseman; Said Hamdioui (DFT, 2011)

Defect Oriented Testing for analog/mixed-signal devices. - Bram Kruseman; Bratislav Tasic; Camelia Hora; Jos Dohmen; Hamidreza Hashempour; Maikel van Beurden; Yizi Xing (ITC, 2011)

Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011)

Gate Leakage Impact on Full Open Defects in Interconnect Lines. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (IEEE Trans. Very Large Scale Integr. Syst., 2011)

Defect Oriented Testing for Analog/Mixed-Signal Designs. - Bram Kruseman; Bratislav Tasic; Camelia Hora; Jos Dohmen; Hamidreza Hashempour; Maikel van Beurden; Yizi Xing (IEEE Des. Test Comput., 2012)

NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test. - Elif Alpaslan; Bram Kruseman; Ananta K. Majhi; Wilmar M. Heuvelman; Jennifer Dworak (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Diagnosis of Local Spot Defects in Analog Circuits. - Ke Huang 001; Haralampos-G. D. Stratigopoulos; Salvador Mir; Camelia Hora; Yizi Xing; Bram Kruseman (IEEE Trans. Instrum. Meas., 2012)

Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? - Said Hamdioui; Davide Appello; Arnaud Grasset; Xinli Gu; Bram Kruseman; Riccardo Mariani; Hermann Obermeir; Srikanth Venkataraman (ETS, 2013)

Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013)

Testing of Analog/Mixed Signal ICs: Past, present and future. - Bram Kruseman (ETS, 2015)

ETS 2016 foreword. - Said Hamdioui; Giorgio Di Natale; Bram Kruseman; Maria K. Michael; Haralampos-G. D. Stratigopoulos (ETS, 2016)