Improved Random Pattern Delay Fault Coverage Using Inversion Test Points. - Soham Roy; Brandon Stiene; Spencer K. Millican; Vishwani D. Agrawal (NATW, 2019)

Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures. - Soham Roy; Brandon Stiene; Spencer K. Millican; Vishwani D. Agrawal (J. Electron. Test., 2020)