Noncontact wafer probe using wireless probe cards. - Chris Sellathamby; Md. Mahbub Reja; Lin Fu; Brenda Bai; Edwin Walter Reid; Steven Slupsky; Igor M. Filanovsky; Kris Iniewski (ITC, 2005)

High throughput non-contact SiP testing. - Brian Moore 001; Chris Sellathamby; Philippe Cauvet; Hérvé Fleury; M. Paulson; Md. Mahbub Reja; Lin Fu; Brenda Bai; Edwin Walter Reid; Igor M. Filanovsky; Steven Slupsky (ITC, 2007)

Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes. - Brian Moore 001; Marc Mangrum; Chris Sellathamby; Md. Mahbub Reja; T. Weng; Brenda Bai; Edwin Walter Reid; Igor M. Filanovsky; Steven Slupsky (ITC, 2008)