Study on Avalanche Uniformity in 1.2KV GaN Vertical PIN Diode with Bevel Edge-Termination. - Ke Zeng; Srabanti Chowdhury; Brendan Gunning; Robert Kaplar; Travis Anderson (IRPS, 2021)

Movement of Current Filaments and its Impact on Avalanche Robustness in Vertical GaN P-N diode Under UIS stress. - Bhawani Shankar; Ke Zeng; Brendan Gunning; Rafael Perez Martinez; Chuanzhe Meng; Jack Flicker; Andrew Binder; Jeramy Ray Dickerson; Robert Kaplar; Srabanti Chowdhury (DRC, 2022)

Study of Avalanche Behavior in 3 kV GaN Vertical P-N Diode Under UIS Stress for Edge-termination Optimization. - Bhawani Shankar; Zhengliang Bian; Ke Zeng; Chuanzhe Meng; Rafael Perez Martinez; Srabanti Chowdhury; Brendan Gunning; Jack Flicker; Andrew Binder; Jeramy Ray Dickerson; Robert Kaplar (IRPS, 2022)