REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. - Michael R. Grimaila; Sooryong Lee; Jennifer Dworak; Kenneth M. Butler; Bret Stewart; Hari Balachandran; Bryan Houchins; Vineet Mathur; Jaehong Park; Li-C. Wang; M. Ray Mercer (VTS, 1999)

Defect-Oriented Testing and Defective-Part-Level Prediction. - Jennifer Dworak; Jason D. Wicker; Sooryong Lee; Michael R. Grimaila; M. Ray Mercer; Kenneth M. Butler; Bret Stewart; Li-C. Wang (IEEE Des. Test Comput., 2001)