Architecture and implementation of a truly parallel ATE capable of measuring pico ampere level current. - Dhruva Acharyya; Kosuke Miyao; David Ting; Daniel Lam; Robert Smith; Pete Fitzpatrick; Brian Buras; John Williamson (ITC, 2011)

Zero Trust Approach to IC Manufacturing and Testing. - Brian Buras; Constantinos Xanthopoulos; Ken Butler; Jason Kim 008 (ITC, 2022)