A CMOS-integrated microinstrument for trace detection of heavy metals. - Steven M. Martin; Fadi H. Gebara; Brian J. Larivee; Richard B. Brown (IEEE J. Solid State Circuits, 2005)

"Split ADC" architecture for deterministic digital background calibration of a 16-bit 1-MS/s ADC. - John A. McNeill; Michael C. W. Coln; Brian J. Larivee (IEEE J. Solid State Circuits, 2005)

Comments on 'Split ADC' architecture for deterministic digital background calibration of a 16-bit 1-MS/s ADC". - Jipeng Li; Un-Ku Moon; John A. McNeill; Michael C. W. Coln; Brian J. Larivee (IEEE J. Solid State Circuits, 2006)

Digital Background-Calibration Algorithm for "Split ADC" Architecture. - John A. McNeill; Michael C. W. Coln; D. Richard Brown; Brian J. Larivee (IEEE Trans. Circuits Syst. I Regul. Pap., 2009)