Design of Wireless Sub-Micron Characterization System. - Brian Moore 001; Christopher J. Backhouse; Martin Margala (VTS, 2004)

Design of wireless on-wafer submicron characterization system. - Brian Moore 001; Martin Margala; Christopher J. Backhouse (IEEE Trans. Very Large Scale Integr. Syst., 2005)

Yield and Cost Modeling for 3D Chip Stack Technologies. - Patrick P. Mercier; S. R. Singh 003; Krzysztof Iniewski; Brian Moore 001; P. O'Shea (CICC, 2006)

High throughput non-contact SiP testing. - Brian Moore 001; Chris Sellathamby; Philippe Cauvet; Hérvé Fleury; M. Paulson; Md. Mahbub Reja; Lin Fu; Brenda Bai; Edwin Walter Reid; Igor M. Filanovsky; Steven Slupsky (ITC, 2007)

Chip to chip communications for terabit transmission rates. - Brian Moore 001; Chris Sellathamby; Steven Slupsky; Kris Iniewski (APCCAS, 2008)

Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes. - Brian Moore 001; Marc Mangrum; Chris Sellathamby; Md. Mahbub Reja; T. Weng; Brenda Bai; Edwin Walter Reid; Igor M. Filanovsky; Steven Slupsky (ITC, 2008)

Contactless testing: Possibility or pipe-dream? - Erik Jan Marinissen; Dae Young Lee; John P. Hayes; Chris Sellathamby; Brian Moore 001; Steven Slupsky; Laurence Pujol (DATE, 2009)

Contactless testing of on-chip oscillator operation. - Igor M. Filanovsky; Brian Moore 001 (ISCAS, 2012)

Pulse restoration in inductive-coupled link with antenna transformer. - Igor M. Filanovsky; Brian Moore 001; T. Brandon (MWSCAS, 2012)