Reliability of aluminum-bearing ohmic contacts to SiC under high current density. - Brian P. Downey; Suzanne E. Mohney; Trevor E. Clark; Joseph R. Flemish (Microelectron. Reliab., 2010)

Pulsed characteristics for high current, large area GaN/Ain resonant tunneling diodes. - Tyler A. Growden; David F. Storm; Evan M. Cornuelle; Logan M. Whitaker; Brian P. Downey; Weidong Zhang; Jeffrey W. Daulton; Richard Molnar; Elliott R. Brown; Paul R. Berger; David J. Meyer (DRC, 2019)

Micro-transfer Printing of GaN HEMTs for Heterogeneous Integration and Flexible RF Circuit Design. - Brian P. Downey; Andy Xie; Shawn Mack; D. Scott Katzer; James G. Champlain; Yu Cao; Neeraj Nepal; Tyler A. Growden; Vikrant J. Gokhale; Robert L. Coffie; Matthew T. Hardy; Edward Beam; et al. (DRC, 2020)