Emitter-Base Profile Optimization of SiGe HBTs for Improved Thermal Stability and Frequency Response at Low-Bias Currents. - Uppili S. Raghunathan; Brian R. Wier; Zachary E. Fleetwood; Michael A. Oakley; Vibhor Jain; John D. Cressler (BCICTS, 2018)

Revisiting Safe Operating Area: SiGe HBT Aging Models for Reliability-Aware Circuit Design. - Brian R. Wier; Rafael Perez Martinez; Uppili S. Raghunathan; Hanbin Ying; Saeed Zeinolabedinzadeh; John D. Cressler (BCICTS, 2018)

Reliability Differences Between SiGe HBTs Optimized for High-Performance and Medium-Breakdown. - Rafael Perez Martinez; Uppili S. Raghunathan; Brian R. Wier; Harrison P. Lee; John D. Cressler (BCICTS, 2019)