Hardware Scheduling for Dynamic Adaptability using External Profiling and Hardware Threading. - Brian Swahn; Soha Hassoun (ICCAD, 2003)

Gate sizing: finFETs vs 32nm bulk MOSFETs. - Brian Swahn; Soha Hassoun (DAC, 2006)

METS: A Metric for Electro-Thermal Sensitivity, and Its Application To FinFETs. - Brian Swahn; Soha Hassoun (ISQED, 2006)

Electro-Thermal Analysis of Multi-Fin Devices. - Brian Swahn; Soha Hassoun (IEEE Trans. Very Large Scale Integr. Syst., 2008)

Multi-Fidelity Surrogate-Based Optimization for Electromagnetic Simulation Acceleration. - Yi Wang; Paul D. Franzon; David Smart; Brian Swahn (ACM Trans. Design Autom. Electr. Syst., 2020)

APOSTLE: Asynchronously Parallel Optimization for Sizing Analog Transistors Using DNN Learning. - Ahmet Faruk Budak; David Smart; Brian Swahn; David Z. Pan (ASP-DAC, 2023)