High-Level Test Generation for VLSI. - Debashis Bhattacharya; Brian T. Murray; John P. Hayes (Computer, 1989)

Hierarchical test generation using precomputed tests for modules. - Brian T. Murray; John P. Hayes (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990)

Test Propagation Through Modules and Circuits. - Brian T. Murray; John P. Hayes (ITC, 1991)

Codesign of architectures for automotive powertrain modules. - Xiaobo Hu 001; Joseph G. D'Ambrosio; Brian T. Murray; Dah-Lain Tang (IEEE Micro, 1994)

Hierarchical testing using precomputed tests for modules. - Brian T. Murray (1994)

Optimal Space Compaction of Test Responses. - Krishnendu Chakrabarty; Brian T. Murray; John P. Hayes (ITC, 1995)

Testing ICs: Getting to the Core of the Problem. - Brian T. Murray; John P. Hayes (Computer, 1996)

Test Width Compression for Built-In Self Testing. - Krishnendu Chakrabarty; Jian Liu; Minyao Zhu; Brian T. Murray (ITC, 1997)

Built-In Self Testing of Sequential Circuits Using Precomputed Test Sets. - Vikram Iyengar; Krishnendu Chakrabarty; Brian T. Murray (VTS, 1998)

Online BIST for Embedded Systems. - Hussain Al-Asaad; Brian T. Murray; John P. Hayes (IEEE Des. Test Comput., 1998)

Scalable Test Generators for High-Speed Datapath Circuits. - Hussain Al-Asaad; John P. Hayes; Brian T. Murray (J. Electron. Test., 1998)

Optimal Zero-Aliasing Space Compaction of Test Responses. - Krishnendu Chakrabarty; Brian T. Murray; John P. Hayes (IEEE Trans. Computers, 1998)

Design of built-in test generator circuits using width compression. - Krishnendu Chakrabarty; Brian T. Murray (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998)

Huffman encoding of test sets for sequential circuits. - Vikram Iyengar; Krishnendu Chakrabarty; Brian T. Murray (IEEE Trans. Instrum. Meas., 1998)

Tolerating Transient Faults in Statically Scheduled Safety-Critical Embedded Systems. - Nagarajan Kandasamy; John P. Hayes; Brian T. Murray (SRDS, 1999)

Built-in Test Pattern Generation For High-Performance Cir cuits Using Twisted-Ring Counters. - Krishnendu Chakrabarty; Brian T. Murray; Vikram Iyengar (VTS, 1999)

Deterministic Built-in Pattern Generation for Sequential Circuits. - Vikram Iyengar; Krishnendu Chakrabarty; Brian T. Murray (J. Electron. Test., 1999)

Providing convincing evidence of safety in X-by-wire automotive systems. - Barbara J. Czerny; Joseph G. D'Ambrosio; Brian T. Murray (HASE, 2000)

Deterministic built-in test pattern generation for high-performance circuits using twisted-ring counters. - Krishnendu Chakrabarty; Brian T. Murray; Vikram Iyengar (IEEE Trans. Very Large Scale Integr. Syst., 2000)

Time-Constrained Failure Diagnosis in Distributed Embedded Systems. - Nagarajan Kandasamy; John P. Hayes; Brian T. Murray (DSN, 2002)

Low-Cost On-Line Fault Detection Using Control Flow Assertions. - Rajesh Venkatasubramanian; John P. Hayes; Brian T. Murray (IOLTS, 2003)

Dependable communication synthesis for distributed embedded systems. - Nagarajan Kandasamy; John P. Hayes; Brian T. Murray (Reliab. Eng. Syst. Saf., 2005)

Time-Constrained Failure Diagnosis in Distributed Embedded Systems: Application to Actuator Diagnosis. - Nagarajan Kandasamy; John P. Hayes; Brian T. Murray (IEEE Trans. Parallel Distributed Syst., 2005)