Parametric Testing of Optical Interfaces. - Brice Achkir; Pavel Zivny; Bill Eklow (ITC, 2008)

Modeling and Application of Multi-Port TSV Networks in 3-D IC. - Wei Yao 002; Siming Pan; Brice Achkir; Jun Fan 001; Lei He 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013)

TEM-Like Launch Geometries and Simplified De-embedding for Accurate Through Silicon Via Characterization. - Francesco de Paulis; Stefano Piersanti; Qian Wang; Jonghyun Cho; Nicholas Erickson; Brice Achkir; Jun Fan 001; James L. Drewniak; Antonio Orlandi (IEEE Trans. Instrum. Meas., 2017)