Understanding the Potential and the Limits of Germanium pMOSFETs for VLSI Circuits From Experimental Measurements. - Paolo Magnone; Felice Crupi; Massimo Alioto; Ben Kaczer; Brice De Jaeger (IEEE Trans. Very Large Scale Integr. Syst., 2011)

Stability evaluation of Au-free Ohmic contacts on AlGaN/GaN HEMTs under a constant current stress. - Tian-Li Wu; Denis Marcon; Steve Stoffels; Shuzhen You; Brice De Jaeger; Marleen Van Hove; Guido Groeseneken; Stefaan Decoutere (Microelectron. Reliab., 2014)

Time dependent dielectric breakdown (TDDB) evaluation of PE-ALD SiN gate dielectrics on AlGaN/GaN recessed gate D-mode MIS-HEMTs and E-mode MIS-FETs. - Tian-Li Wu; Denis Marcon; Brice De Jaeger; Marleen Van Hove; Benoit Bakeroot; Steve Stoffels; Guido Groeseneken; Stefaan Decoutere; Robin Roelofs (IRPS, 2015)

ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric. - Eliana Acurio; Lionel Trojman; Brice De Jaeger; Benoit Bakeroot; Stefaan Decoutere (IRPS, 2021)

Vertical stack reliability of GaN-on-Si buffers for low-voltage applications. - Elena Fabris; Matteo Borga; Niels Posthuma; Ming Zhao; Brice De Jaeger; Shuzhen You; Stefaan Decoutere; Matteo Meneghini; Gaudenzio Meneghesso; Enrico Zanoni (IRPS, 2021)