On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise. - Brice Grandchamp; Cristell Maneux; Nathalie Labat; André Touboul; Thomas Zimmer (Microelectron. Reliab., 2004)

Thermal aging model of InP/InGaAs/InP DHBT. - Sudip Ghosh 002; François Marc; Cristell Maneux; Brice Grandchamp; G. A. Koné; Thomas Zimmer (Microelectron. Reliab., 2010)

Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. - G. A. Koné; Brice Grandchamp; C. Hainaut; François Marc; Cristell Maneux; Nathalie Labat; Thomas Zimmer; Virginie Nodjiadjim; Jean Godin (Microelectron. Reliab., 2010)

Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design. - Sudip Ghosh 002; Brice Grandchamp; G. A. Koné; François Marc; Cristell Maneux; Thomas Zimmer; Virginie Nodjiadjim; Muriel Riet; Jean-Yves Dupuy; Jean Godin (Microelectron. Reliab., 2011)

Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. - G. A. Koné; Brice Grandchamp; C. Hainaut; François Marc; Cristell Maneux; Nathalie Labat; Thomas Zimmer; Virginie Nodjiadjim; Muriel Riet; Jean Godin (Microelectron. Reliab., 2011)

Advancements on reliability-aware analog circuit design. - Bertrand Ardouin; Jean-Yves Dupuy; Jean Godin; Virginie Nodjiadjim; Muriel Riet; François Marc; Gilles Amadou Koné; Sudip Ghosh 002; Brice Grandchamp; Cristell Maneux (ESSCIRC, 2012)