Defense data network management system. - Bruce C. Kim (LCN, 1991)

Network Performance Monitoring And Fault Detection On The Gtnet. - Philip W. Mathis; Bruce C. Kim (NOMS, 1992)

A Methodology for Generation and Collection of Multiprocessor Traces. - Paul J. Bond; Bruce C. Kim; Christopher A. Lee 003; David E. Schimmel (MASCOTS, 1994)

A Novel Low-Cost Approach to MCM Interconnect Test. - Bruce C. Kim; Abhijit Chatterjee; Madhavan Swaminathan; David E. Schimmel (ITC, 1995)

An integrated network management system: the design for AIN and B-ISDN. - Bruce C. Kim; Hisao Fujikawa; Tetsuji Tamaka (NOMS, 1996)

Low-cost DC built-in self-test of linear analog circuits using checksums. - Abhijit Chatterjee; Bruce C. Kim; Naveena Nagi (VLSI Design, 1996)

Low-cost diagnosis of defects in MCM substrate interconnections. - Bruce C. Kim; Abhijit Chatterjee; Madhavan Swaminathan (VTS, 1996)

DC Built-In Self-Test for Linear Analog Circuits. - Abhijit Chatterjee; Bruce C. Kim; Naveena Nagi (IEEE Des. Test Comput., 1996)

Analog and Mixed-Signal Benchmark Circuits-First Release. - Bozena Kaminska; Karim Arabi; I. Bell; José L. Huertas; Bruce C. Kim; Adoración Rueda; Mani Soma; Prashant Goteti (ITC, 1997)

A Survey of Test Techniques for MCM Substrates. - Madhavan Swaminathan; Bruce C. Kim; Abhijit Chatterjee (J. Electron. Test., 1997)

A high throughput test methodology for MCM substrates. - Bruce C. Kim; David C. Keezer; Abhijit Chatterjee (ITC, 1998)

A Novel Routing Algorithm for MCM Substrate Verification Using Single-Ended Prob. - Rongchang Yan; Bruce C. Kim (VTS, 1998)

A probe scheduling algorithm for MCM substrates. - Bruce C. Kim; Pinshan Jiang; Se Hyun Park (ITC, 1999)

A Novel Test Methodology for MEMS Magnetic Micromotors. - Bruce C. Kim; Krishna Marella (VTS, 1999)

An Approach for Selection of Test Points for Analog Fault Diagnosis. - Kranthi K. Pinjala; Bruce C. Kim (DFT, 2003)

Benzocyclobutene (BCB) Based Intracortical Neural Implant. - Kee-Keun Lee; Jiping He; Amarjit Singh; Bruce C. Kim (ICMENS, 2003)

RF MEMS Switch for Wireless LAN Applications. - Kee-Keun Lee; Bruce C. Kim (ICMENS, 2003)

MEMS Spring Probe for Next Generation Wafer Level Testing. - Kee-Keun Lee; Bruce C. Kim (ICMENS, 2003)

Automatic Diagnostic Program Generation for Mixed Signal Load Board. - Kranthi K. Pinjala; Bruce C. Kim; Pramodchandran N. Variyam (ITC, 2003)

Impact of Parameter Imbalances on Transmit Diversity OFDM System Performance. - Kyung-Geun Lee; Hyoung-Kyu Song; Mi-Jeong Kim; Sang-Tae Kim; Bruce C. Kim; Young-Hwan You (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2003)

A new BIST scheme for 5GHz low noise amplifiers. - Jee-Youl Ryu; Bruce C. Kim; Iboun Taimiya Sylla (ETS, 2004)

A new design for built-in self-test of 5GHz low noise amplifiers. - Jee-Youl Ryu; Bruce C. Kim (SoCC, 2004)

Advanced Mems for High Power Integrated Distribution Systems. - Rahim Kasim; Bruce C. Kim; Josef Drobnik (ICMENS, 2005)

The Newsletter of Test Technology Council of the IEEE Computer Society. - Bruce C. Kim (J. Electron. Test., 2005)

Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit. - Jee-Youl Ryu; Bruce C. Kim (J. Electron. Test., 2005)

Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers. - Jee-Youl Ryu; Bruce C. Kim (Microelectron. J., 2005)

DIBPro: Automatic Diagnostic Program Generation Tool. - Venkat Kalyanaraman; Bruce C. Kim; Pramodchandran N. Variyam; Sasikumar Cherubal (ITC, 2006)

Session Abstract. - Yervant Zorian; Bruce C. Kim (VTS, 2006)

Test Technology Technical Council Newsletter. - Bruce C. Kim (IEEE Des. Test Comput., 2006)

TTTC Newsletter. - Bruce C. Kim (IEEE Des. Test Comput., 2006)

Guest Editors' Introduction: Big Innovations in Small Packages. - Bruce C. Kim; Yervant Zorian (IEEE Des. Test Comput., 2006)

A Novel RF Test Scheme Based on a DFT Method. - Jee-Youl Ryu; Bruce C. Kim; Iboun Taimiya Sylla (J. Electron. Test., 2006)

A new low-cost RF built-in self-test measurement for system-on-chip transceivers. - Jee-Youl Ryu; Bruce C. Kim; Iboun Taimiya Sylla (IEEE Trans. Instrum. Meas., 2006)

Low cost automatic mixed-signal board test using IEEE 1149.4. - Srividya Sundar; Bruce C. Kim; Toby Byrd; Felipe Toledo; Sudhir Wokhlu; Erika Beskar; Raul Rousselin; David Cotton; Gary Kendall (ITC, 2007)

Test Technology TC Newsletter. - Bruce C. Kim (IEEE Des. Test Comput., 2007)

Test Technology Newsletter. - Bruce C. Kim (J. Electron. Test., 2007)

Test Technology Newsletter April 2007. - Bruce C. Kim (J. Electron. Test., 2007)

Test Technology Newsletter - October 2007. - Bruce C. Kim (J. Electron. Test., 2007)

Test Technology Newsletter - December 2007. - Bruce C. Kim (J. Electron. Test., 2007)

Guest Editors' Introduction: The Evolution of RFIC Design and Test. - Bruce C. Kim; Craig Force (IEEE Des. Test Comput., 2008)

Automatic diagnostic tool for Analog-Mixed Signal and RF load boards. - Sukeshwar Kannan; Bruce C. Kim (ITC, 2009)

RADPro: Automatic RF analyzer and diagnostic program generation tool. - Sukeshwar Kannan; Bruce C. Kim; Ganesh Srinivasan; Friedrich Taenzlar; Richard Antley; Craig Force; Falah Mohammed (ITC, 2010)

Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. - Sukeshwar Kannan; Bruce C. Kim; Ganesh Srinivasan; Friedrich Taenzler; Richard Antley; Craig Force (J. Electron. Test., 2011)

Analysis of propagation delay in 3 - D stacked DRAM. - Sukeshwar Kannan; Bruce C. Kim; Sang-Bock Cho; Byoungchul Ahn (ISCAS, 2012)

Modeling and characterization of CNT-based TSV for high frequency applications. - Sukeshwar Kannan; Bruce C. Kim; Anurag Gupta; Seok-Ho Noh; Li Li; Sang-Bock Cho (ISCAS, 2012)

Fault Modeling and Multi-Tone Dither Scheme for Testing 3D TSV Defects. - Sukeshwar Kannan; Bruce C. Kim; Byoungchul Ahn (J. Electron. Test., 2012)

Design of nanosensing platform based on zinc oxide nanowire arrays. - Anurag Gupta; Mitchell Spryn; Bruce C. Kim; Eugene Edwards; Christina Brantley; Paul Ruffin (ISCAS, 2013)

Development of hybrid electrical model for CNT based Through Silicon Vias. - Kaushal Kannan; Sukeshwar Kannan; Bruce C. Kim; Sang-Bock Cho (ISCAS, 2013)

Physics Based Fault Models for Testing High-Voltage LDMOS. - Sukeshwar Kannan; Bruce C. Kim; Anurag Gupta; Friedrich Taenzler; Richard Antley; Ken Moushegian (VLSI Design, 2013)

Physics-Based Low-Cost Test Technique for High Voltage LDMOS. - Sukeshwar Kannan; Kaushal Kannan; Bruce C. Kim; Friedrich Taenzler; Richard Antley; Ken Moushegian; Kenneth M. Butler; Doug Mirizzi (J. Electron. Test., 2013)

A novel BIST technique for LDMOS drivers. - Bruce C. Kim; Saikat Mondal; Friedrich Taenzler; Kenneth Moushegian (MWSCAS, 2014)

Wide rear vehicle recognition using a fisheye lens camera image. - Jin-Seong Jeong; Hyun-Tae Kim; Bruce C. Kim; Sang-Bock Cho (APCCAS, 2016)

Text information acquisition method of traffic signs for autonomous navigation. - Hyun-Tae Kim; Jin-Seong Jeong; Bruce C. Kim; Sang-Bock Cho (APCCAS, 2016)

Recent advances in TSV inductors for 3D IC technology. - Bruce C. Kim; Sang-Bock Cho (ISOCC, 2016)

Modeling and Crosstalk Evaluation of 3-D TSV-Based Inductor With Ground TSV Shielding. - Saikat Mondal; Sang-Bock Cho; Bruce C. Kim (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Design of 3D Inductors for IoT Security. - Bruce C. Kim; Sang-Bock Cho (ISOCC, 2018)