Speed Binning with Path Delay Test in 150-nm Technology. - Bruce Cory; Rohit Kapur; Bill Underwood (IEEE Des. Test Comput., 2003)

Overcoming Fault Test Coverage with Time-Resolved Emission (TRE) Probing. - Steven Kasapi; Bruce Cory (Microelectron. Reliab., 2004)

Needs fabless yield ramp foundry partnership to be most successful. - Bruce Cory (ITC, 2005)

OCI: Open Compression Interface. - Bruce Cory; Rohit Kapur; Mick Tegethoff; Mark Kassab; Brion L. Keller; Kee Sup Kim; Dwayne Burek; Steven F. Oakland; Benoit Nadeau-Dostie (ITC, 2006)

The Role of ATPG Fault Diagnostics in Driving Physical Analysis. - Roger Nicholson; Cathy Kardach; Bruce Cory (ITC, 2006)

Scan chain failure analysis using laser voltage imaging. - Joy Y. Liao; Steven Kasapi; Bruce Cory; Howard L. Marks; Yin S. Ng (Microelectron. Reliab., 2010)

Foundry workflow for dynamic-EFA-based yield ramp. - Cathy Kardach; I. Kapilevich; Jeffrey A. Block; Ted R. Lundquist; Steven Kasapi; J. Liao; Yin S. Ng; Bruce Cory (Microelectron. Reliab., 2011)

Systematic defect screening in controlled experiments using volume diagnosis. - B. Seshadri; P. Gupta; Y. T. Lin; Bruce Cory (ITC, 2012)

An Industrial Study of System-Level Test. - Sounil Biswas; Bruce Cory (IEEE Des. Test Comput., 2012)

Innovative practices session 9C: Yield improvement: Challenges and directions. - B. Seshadri; Bruce Cory; S. Mitra (VTS, 2013)