Novel Techniques for Achieving High At-Speed Transition Fault Test Coverage for Motorola's Microprocessors Based on PowerPC(tm) Instruction Set Architecture. - Nandu Tendolkar; Rajesh Raina; Rick Woltenberg; Xijiang Lin; Bruce Swanson; Greg Aldrich (VTS, 2002)

High-Frequency, At-Speed Scan Testing. - Xijiang Lin; Ron Press; Janusz Rajski; Paul Reuter; Thomas Rinderknecht; Bruce Swanson; Nagesh Tamarapalli (IEEE Des. Test Comput., 2003)

At-Speed Testing with Timing Exceptions and Constraints-Case Studies. - Dhiraj Goswami; Kun-Han Tsai; Mark Kassab; Takeo Kobayashi; Janusz Rajski; Bruce Swanson; Darryl Walters; Yasuo Sato; Toshiharu Asaka; Takashi Aikyo (ATS, 2006)

Improved Handling of False and Multicycle Paths in ATPG. - Vlado Vorisek; Bruce Swanson; Kun-Han Tsai; Dhiraj Goswami (VTS, 2006)

A Real Case of Significant Scan Test Cost Reduction. - Selina Sha; Bruce Swanson (ISVLSI, 2008)

Detecting and diagnosing open defects. - Dat Tran; LeRoy Winemberg; Darrell Carder; Xijiang Lin; Joe LeBritton; Bruce Swanson (ITC, 2010)