Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films. - Gustavo Gonçalves Dalkiranis; João H. C. Bocchi; Bruno Bassi Millan Torres; Aitor Lopeandia-Fernández; Osvaldo N. Oliveira; Gregório C. Faria (IEEE Trans. Instrum. Meas., 2025)