Low-PBTS defect-engineered high-mobility metal-oxide BEOL transistors. - Bastien Beltrando; Bruno Coppolelli; Jung-Bae Kim; Yang Ho Bae; Stephen Weeks; Lisa Enman; Ghazal Saheli; Davide Cornigli; Stuart Brinkley; Mark Saly; Luca Larcher; Dong Kil Yim; et al. (IRPS, 2024)

Impact of Al-based Dipole Formation on Gate Stack Integrity and Reliability. - Bruno Coppolelli; Davide Cornigli; Zheyuan Chen; Andrea Padovani; Sara Vecchi; Yanliu Dang; Luc Thomas; Luca Vandelli; Jianxin Lei; Naomi Yoshida; Renu Whig; Federico Nardi; et al. (IRPS, 2025)